Probing nanostructured materials using X-ray fluorescence analysis

Micro X-ray fluorescence in materials characterization

Micro X-ray fluorescence ~MXRF! offers the analyst a new approach to materials characterization. The range of applications is expanding rapidly. Single point analysis has been demonstrated for nanoliter volumes with detection limits at the 0.5 ng level. MXRF can be used as an element specific detector for capillary electrophoresis. Elemental imaging applications include analysis of sample corro...

X-ray Absorption Spectroscopy Using X–ray Fluorescence Spectrometer

Strong characteristic Kα X-ray lines are accompanied by weak lines due to the radiative Auger effect (RAE) [1, 2]. The characteristic Kα fluorescent X-rays (K-L2,3 lines) are emitted by the 2p→1s electric dipole transition after one of the 1s electron photoionization, Though the probability is less than 0.01, one of the 2p electrons is excited into an unoccupied discrete or continuum level simu...

Determining the Content of Silicon Dioxide in Bauxites Using X-Ray Fluorescence Spectrometry

The X-ray fluorescence spectrometry and the MA.BM.006 reference spectrophotometric methods were used to determine the content of SiO2 (%) in bauxites from different deposits. The treatment of samples prior to the analysis involved the following steps: annealing, melting using the borax method,  and the formation of beads. Certified reference bauxite samples were used for the cali...

Subsurface Particle Analysis using X-ray Computed Tomography and Confocal X- ray Fluorescence

X-Ray Fluorescence Analysis of Gemstones

The energy dispersive X-ray fluorescence analysis (ED-XRFA) is a well-established tool for multielement composition analysis in different fields/1/. It works non-conducting and it is non-destructive. No particular sample preparation is necessary if the specimens have an almost planar and smooth surface. For the characterization of precious gemstone material it is also important that the deposit...